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New Particle-Induced Single Event Latchup Mechanism Observed in a Cryogenic CMOS Readout Integrated Circuit
New Particle-Induced Single Event Latchup Mechanism Observed in a Cryogenic CMOS Readout Integrated Circuit
2010
Cheryl J. Marshall
Paul W. Marshall
Raymond L. Ladbury
Augustyn Waczynski
Roger Foltz
Rajan Arora
Nathaniel A. Dodds
John D. Cressler
Jonathan A. Pellish
Dakai Chen
Duncan M. Kahle
Gregory Delo
Emily Kan
Nicholas Boehm
Robert A. Reed
Kenneth A. LaBel
Keywords:
Particle
Cryogenics
Bipolar junction transistor
CMOS
Readout integrated circuit
Ionization
Integrated circuit
Electronic engineering
Materials science
single event latchup
Optoelectronics
Correction
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