Structural and morphology analysis of Nb0.25Bi2Se3 single crystal

We report successfully single crystal growth of Nb0.25Bi2Se3 by self-flux method via vacuum encapsulation process in simple automated furnace. X-ray diffraction (XRD) pattern on as grown crystal flake result shows the crystal growth is in (00l) plane direction i.e. c-orientation only. Powder XRD (PXRD) pattern followed by Rietveld refinement of crushed crystal, confirms the phase purity of the studied sample that shows the sample growth in single phase only which having R-3m space group of rhombohedral crystalline structure. Detailed microstructure analysis i.e. Scanning Electron Microscope (SEM) image shows the morphology study of as grown single crystal that resultant is in layered type laminar structure. Further Energy Dispersive X-ray spectroscopy measurement confirms their elemental analysis into their stoichiometry ratio i.e. nearer to Nb0.25Bi2Se3. Here we report the crystal growth process followed by structural and morphology analysis of topological superconductor i.e. Nb0.25Bi2Se3 single crystal.