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An Electrostatic Force Probe for Surface Profile Measurement in Noncontact Condition
An Electrostatic Force Probe for Surface Profile Measurement in Noncontact Condition
2013
So Ito
Zhigang Jia
Shigeaki Goto
Keiichiro Hosobuchi
Yuki Shimizu
Gaofa He
Wei Gao
Keywords:
Scanning probe microscopy
Non-contact atomic force microscopy
Magnetic force microscope
Scanning capacitance microscopy
Kelvin probe force microscope
Scanning Hall probe microscope
Analytical chemistry
Materials science
Optics
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