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Characterization of Random Telegraph Noise in Scaled High-κ/Metal-Gate MOSFETs with SiO2/HfO2 Gate Dielectrics
Characterization of Random Telegraph Noise in Scaled High-κ/Metal-Gate MOSFETs with SiO2/HfO2 Gate Dielectrics
2013
Meng Li
Runsheng Wang
Jibin Zou
Ru Huang
Keywords:
Metal gate
Dielectric
Electronic engineering
Materials science
Optoelectronics
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