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Strain measurements of Ge epilayers on Si by Spectroscopic Ellipsometry
Strain measurements of Ge epilayers on Si by Spectroscopic Ellipsometry
2014
Ayana Ghosh
Nalin Fernando
Amber A. Medina
Cayla M. Nelson
Stefan Zollner
S. C. Xu
Jose Menendez
John Kouvetakis
Keywords:
Ellipsometry
Analytical chemistry
Strain (chemistry)
Materials science
spectroscopic ellipsometry
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