Determination of the number of ions in the Oxford electron beam ion trap

Abstract In order to determine absolute numbers of ions trapped in the Oxford electron beam ion trap (EBIT), the efficiency of a lithium-drifted silicon X-ray detector has been characterized over the energy range 1.5–15 keV using the Oxford scanning proton microprobe. Preliminary results for the number densities of neon-like barium and highly charged argon ions are presented.