Nanometer-scale regular grooves and ridges created with scanning tunnelling microscope
1998
Abstract The scanning tunnelling microscope (STM) has been employed to fabricate grooves by extracting Si atoms out of the Si(111)-7×7 surface and deposit the Si atoms back onto the Si(111)-7×7 surface at room temperature. The deposited Si atoms can form a straight ridge under controlled conditions. The width of the ridge can be controlled better than 2 nm. Ridges can only be formed after the tip extracts enough atoms out of the Si(111)-7×7 surface. If the tip is clean, no atoms will be deposited from the tip under the depositing conditions. This suggests that the deposited atoms are silicon atoms extracted out of the Si(111)-7×7 surface. The deposition mechanism is discussed.
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