Frontiers of magnetic force microscopy

Since it was first demonstrated in 1987, magnetic force microscopy (MFM) has become a truly widespread and commonly used characterization technique that has been applied to a variety of research and industrial applications. Some of the main advantages of the method includes its high spatial resolution (typically ∼50 nm), ability to work in variable temperature and applied magnetic fields, versatility, and simplicity in operation, all without almost any need for sample preparation. However, for most commercial systems, the technique has historically provided only qualitative information, and the number of available modes was typically limited, thus not reflecting the experimental demands. Additionally, the range of samples under study was largely restricted to “classic” ferromagnetic samples (typically, thin films or patterned nanostructures). Throughout this Perspective article, the recent progress and development of MFM is described, followed by a summary of the current state-of-the-art techniques and ob...