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Kapitza conductance of Bi/Sapphire interface measured by time-resolved x-ray diffraction
Kapitza conductance of Bi/Sapphire interface measured by time-resolved x-ray diffraction
2010
Yu-Miin Sheu
Yi-Jiunn Chien
Ctirad Uher
Mariano Trigo
J. Chen
Shambhu Ghimire
Donald A. Walko
E. R. Peterson
D. A. Arms
Eric C. Landahl
David A. Reis
Keywords:
Nuclear magnetic resonance
Thin film
Single crystal
X-ray crystallography
Conductance
Molecular beam epitaxy
Sapphire
Optics
Materials science
Condensed matter physics
Correction
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