Old Web
English
Sign In
Acemap
>
Paper
>
Study of orthorhombic phase of low-temperature fabricated Hf x Zr 1−x O 2 thin films using synchrotron X-ray
Study of orthorhombic phase of low-temperature fabricated Hf x Zr 1−x O 2 thin films using synchrotron X-ray
2021
Takashi Onaya
Toshihide Nabatame
Yong Chan Jung
Heber Hernández-Arriaga
Jaidah Mohan
Harrison Sejoon Kim
Naomi Sawamoto
Chang-Yong Nam
Esther H. R. Tsai
Takahiro Nagata
Ji Young Kim
Atsushi Ogura
Keywords:
Phase (matter)
Analytical chemistry
Synchrotron
Materials science
Orthorhombic crystal system
Thin film
X-ray
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]