Device and method for detecting relationship between single event effects and time sequence characteristics of FPGA (Field Programmable Gate Array)

The invention discloses a device for detecting the relationship between single event effects and time sequence characteristics of an FPGA (Field Programmable Gate Array). The device comprises an FPGA test circuit, a time sequence control circuit and an upper computer control module, wherein the time sequence control circuit is connected to the FPGA test circuit, and the FPGA test circuit is connected to the upper computer control module; during the process of testing, the FPGA test circuit and the time sequence control circuit are respectively connected with an FPGA to be tested, and the time sequence control circuit is further connected to a single event effect test device; the time sequence control circuit generates work time sequence control signals for the FPGA to be tested and radiation time sequence control signals for the single event effect test device; the FPGA test circuit is used for storing configured data of the FPGA to be tested and realizing the configuration and readback of the configured data on the FPGA to be tested; the FPGA test circuit is further used for data transmission with the FPGA to be tested and the upper computer control module and triggering the time sequence control circuit; and the upper computer control module is used for controlling the FPGA test circuit and respectively comparing the configured data with operational data of the FPGA to be tested under different working states.