Characterization of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors in the soft X-ray range

Abstract We at Siberian Synchrotron Radiation Center (Novosibirsk) have conducted comparative studies of spatial homogeneity of sensitivity and radiation resistance of semiconductor detectors SPD-100UV developed by the Physical Technical Institute (St. Petersburg) as well as AXUV-100 (made by IRD Inc., USA). These works were carried out at the “Cosmos” station on the VEPP-4 storage ring in the soft X-ray range (80–1000 eV).