SPIX: a new technique for quantitative surface spectroscopy applied to SInP(001)

L. Rodríguez-Fernández,W. N. Lennard,H. Xia,G.R. Massoumi

SPIX: a new technique for quantitative surface spectroscopy applied to SInP(001)

1996

L. Rodríguez-Fernández
W. N. Lennard
H. Xia
G.R. Massoumi

A new technique for quantitative surface spectroscopy is described using charged particle X-ray excitation. The method is applied to determine a saturation coverage of 1.2 ± 0.24 ML for sulphur-passivated InP(001).

Keywords:

Analytical chemistry
Spectroscopy
Passivation
Helium-4
Quantitative analysis (chemistry)
Indium phosphide
Saturation (chemistry)
Nuclear magnetic resonance
Charged particle
Chemistry
Materials science
Excitation

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