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Single-shot structural analysis byhigh-energy X-ray diffraction usingan ultrashort all-optical source
Single-shot structural analysis byhigh-energy X-ray diffraction usingan ultrashort all-optical source
2017
R. Rakowski
Grigory Golovin
Jordan T O'Neal
Jun Zhang
Ping Zhang
Baozhen Zhao
Matthew D. Wilson
Matthew C. Veale
P. Seller
S.-Y. Chen
Sudeep Banerjee
Donald P. Umstadter
Matthias Fuchs
Keywords:
X-ray crystallography
Analytical chemistry
Materials science
single shot
Optics
all optical
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