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A Study on Measurement of LSI Immunity for PCB Analysis
A Study on Measurement of LSI Immunity for PCB Analysis
2004
Ichikawa Kouji
Sakurai Yukihiko
Inagaki Masashi
Matsui Takeshi
Mabuchi Yuichi
Nakamura Atsushi
Hayashi Toru
Keywords:
Immunity
Electronic engineering
Engineering
Electrical engineering
Correction
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