ANALYTICAL ELECTRON MICROSCOPY OF DEFECTS IN PHOTOREFRACTIVE BaTiO 3 CRYSTAL

Defects in photorefractive BaTiO 3 crystal, obtained by the top seed solution growth method, have been studied by analytical electron microscopy. Thin foils containing inclusions for transmission electron micrsocopy (TEM) were prepared by ion milling the mechanically polished thin sections. Combining diffraction and electron energy loss spectroscopy in a TEM, the inclusions were identified as amorphous Ba-Ti-O and Ba 6 Ti 17 O 40 . Other microdefects which are only visible in the TEM have been identified as crystalline precipitates.