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An application of electrical resistivity tomography to investigate leakage pathways in the exploitation of IREO
An application of electrical resistivity tomography to investigate leakage pathways in the exploitation of IREO
2021
Shu Chen
Gang Min
Rong Cheng
Rongbo Shu
Lin Qiu
Kang Liu
Keywords:
Leakage (electronics)
Optoelectronics
Electrical resistivity tomography
Materials science
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