Old Web
English
Sign In
Acemap
>
Paper
>
AFM current-imaging study for current density through nanocrystalline silicon dots embedded in SiO2
AFM current-imaging study for current density through nanocrystalline silicon dots embedded in SiO2
2005
M. A. Salem
Hiroshi Mizuta
Shunri Oda
Ying Fu
Magnus Willander
Keywords:
Analytical chemistry
Atomic force microscopy
Current density
Nanocrystalline silicon
Ceramic materials
Materials science
imaging study
Nanotechnology
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]