Determination of ZnSe(Te) stoichiometry and dopant content by X-ray analysis

Light output and response duration of isovalently doped zinc selenide single crystals depend on their element composition as well as on the dopant content and its distribution. For monitoring of these parameters, X-ray analysis suits best of all and was developed here. The ratio of Kα line intensities of Se and Zn was derived for the determination of ZnSe(Te) stoichiometry by taking into account the contribution of secondary excitation. The linear dependence of the TeKα intensity on the Te content was used for determining the latter. An annular 109Cd source was used for the excitation of Zn and Se Kα-lines and the Kα line of Te was excited by three 241Am sources. The measurement error (Sr) of ZnSe elemental composition was 0.01. The measurement error of the Te content was 0.06-0.09 in the range of 0.01-0.5% Te.