FIB lift-out of conducting ferroelectric domain walls in hexagonal manganites

A focused ion beam (FIB) methodology is developed to lift out suitable specimens containing charged domain walls in improper ferroelectric ErMnO3. The FIB procedure allows for extracting domain wall sections with well-defined charge states, enabling accurate studies of their intrinsic physical properties. Conductive atomic force microscopy (cAFM) measurements on a 700 nm thick lamella demonstrate enhanced electronic transport at charged domain walls consistent with previous bulk measurements. A correlation is shown between domain wall currents in cAFM and applied ion beam polishing parameters, providing a guideline for further optimization. These results open the door for the study and functionalization of individual domain walls in hexagonal manganites, an important step toward the development of atomic scale domain-wall devices that can operate at low energy.A focused ion beam (FIB) methodology is developed to lift out suitable specimens containing charged domain walls in improper ferroelectric ErMnO3. The FIB procedure allows for extracting domain wall sections with well-defined charge states, enabling accurate studies of their intrinsic physical properties. Conductive atomic force microscopy (cAFM) measurements on a 700 nm thick lamella demonstrate enhanced electronic transport at charged domain walls consistent with previous bulk measurements. A correlation is shown between domain wall currents in cAFM and applied ion beam polishing parameters, providing a guideline for further optimization. These results open the door for the study and functionalization of individual domain walls in hexagonal manganites, an important step toward the development of atomic scale domain-wall devices that can operate at low energy.