High frequency ESR of native point defects in beryllium doped c‐BN single crystals

High frequency (95 GHz) ESR measurements have been performed down to 5 K, on three cubic boron nitride (c-BN) single crystals doped with beryllium. The measured samples exhibit at low temperature different ESR spectra, which are sensitive to low temperature in situ illumination using a series of Kr + - and Ar + -laser lines. The analysis of the ESR spectra resulted in the identification of several native paramagnetic centers responsible for the observed component spectra lines.