Old Web
English
Sign In
Acemap
>
Paper
>
A Board Level Parallel Test Circuit and a Short Circuit Failure Repair Circuit for High-Density, Low-Power DRAMs
A Board Level Parallel Test Circuit and a Short Circuit Failure Repair Circuit for High-Density, Low-Power DRAMs
1997
Kiyohiro Furutani
Tsukasa Ooishi
Mikio Asakura
Hideto Hidaka
Hideyuki Ozaki
Michihiro Yamada
Keywords:
Redundancy (engineering)
Parallel computing
Engineering
Electronic engineering
Short circuit
high density
Dram
Correction
Source
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]