A simpler method for life-testing laser diodes
1999
Abstract The procedure of measuring the I(V) characteristics of laser diodes at fixed time steps of a constant current life-test is revised. The possibility of using the test equipment itself to extract the characteristics is investigated and demonstrated. This eliminates the most troublesome manual procedure in life-testing several devices.
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
2
References
2
Citations
NaN
KQI