Preparation and Characterization of Silicon Nanoparticles for Solution-Processed Thin Film

We describe the synthesis of the alkoxy-capped silicon nanoparticles (Si NPs) via solution route without an explicit reduction process. Based on the UV–visible absorption and photoluminescence (PL) emission spectra of the alkoxy-capped Si NPs, the average size of Si NPs is estimated to be ca. 3 nm. Fourier transform infrared (FT-IR) spectroscopy on the sintered Si thin film confirms elimination of the alkyl groups from the nanoparticles as evidenced by the shrinkage of the absorption peaks corresponding to –CHn and Si–OR. Although the silicon film was highly resistive, we have consistently observed the electrical conduction from films coated with the doped NPs.