Optical simulation of a DOI detector with a stack of planer scintillators

A novel DOI detector with a stack of planer scintillators (SOPS) allows easier position estimation and simpler fabrication. To investigate suitable optical characteristics of the proposed detector, we constructed a Monte Carlo simulator. In this paper, we studied the relationship between the surface roughness of monolithic scintillator and the spatial resolution. We defined the parameter of scintillator's surface roughness as roughness rate which was used to statistically determine triangle patch's angle in the simulator. We simulated a six layer SOPS and found that smoother surface leads to higher spatial resolution for x and y direction. Furthermore we applied laser-processed boundaries to the SOPS (SOPS with LPB). We confirmed that SOPS with LPB provided better spatial resolution although it leads to additional process in fabrication to some extent.