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Spatially resolved analysis of resistive switching in transition metal oxide thin films
Spatially resolved analysis of resistive switching in transition metal oxide thin films
2011
Ruth Christine Landrock
Rainer Waser
Keywords:
Oxide
Transition metal
Conductive atomic force microscopy
Thin film
Resistive random-access memory
Pulsed laser deposition
Analytical chemistry
Materials science
Resistive touchscreen
spatially resolved
resistive switching
Nanotechnology
Correction
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