Determination of the refractive index and the thickness of double side coated thin films
2016
The well-known Swanepoel’s method to calculate the refractive index and the thickness of thin films based on their optical
transmission, is only applicable to single facet coated substrates (SFCS), and does not return the correct values when
applied to double facet coated substrates (DFCS). In this work, we present a novel model and an analytical method to
characterize the thin film coated on both sides of a substrate. In order to confirm the validity of our novel method, we have
fabricated two samples; a DFCS and a SFCS with identical thin films. The thin film on SFCS is analyzed using Swanepoel’s
method, and the thin films on DFCS are analyzed using our novel method. The refractive i…
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