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Saturated-Excitation Image-Scanning Microscopy for Super-resolution imaging
Saturated-Excitation Image-Scanning Microscopy for Super-resolution imaging
2018
Kenta Temma
Ryosuke Oketani
René Richter
Rainer Heinzmann
Nicholas I. Smith
Katsumasa Fujita
Keywords:
Materials science
scanning microscopy
Fluorescence
Superresolution
Excitation
Microscopy
Optics
Correction
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