Old Web
English
Sign In
Acemap
>
Paper
>
Nanoscaling analysis of multiple gate vertical MOSFET with the oblique rotating implantation (ORI) method
Nanoscaling analysis of multiple gate vertical MOSFET with the oblique rotating implantation (ORI) method
2009
Ismail Saad
Razak Mohd. Ali Lee
Zul Atfyi Fauzan Mohammed Napiah
Munawar A. Riyadi
Razali Ismail
Vijay K. Arora
Keywords:
MOSFET
Oblique case
Engineering
Electronic engineering
Engineering physics
Mechanical engineering
Correction
Cite
Save
Machine Reading By IdeaReader
0
References
0
Citations
NaN
KQI
[]