A Novel Free-Space Gaussian Beam Method for the Characterization of Anisotropic Materials

This paper presents a novel design of a system for free-space characterization of RF anisotropic materials. This proposed method utilizes three probes to capture full scattering matrix data as a function of incident angle and frequency to extract the intrinsic material parameters. This system was designed, implemented, and integrated with LabView to provide automated measurement capabilities. Finally, the results were validated by fabricating and testing a frequency selective surface.