Reliability Research of Electronic Circuit Based on Multisim 10

Compared with the traditional method,using Multisim 10 platform to research the reliability of electronic circuit design can effectively solve accurate tolerance analysis of the electronic circuit design.This method called statistical sampling is based on Bernoulli Theorem in Probability Theory.According to the specified distribution rule,it selects the Electron Component and work condition parameters within the tolerance randomly,then by virtue of calculation,analyzes the statistical regularity of the circuit performance.Through examples,the methods and steps of the Monte Carlo analysis and the worst case analysis by Multisim 10 are illustrated,and the outstanding effect and broad prospect of Multisim 10 in the reliability consideration of electronic circuit design are presented.