In-situ Electron Microscopy: Applications in Physics, Chemistry and Materials Science

((short)) Basics Thermodynamics Mechanical Properties Magnetic Properties Optical Properties Electronic Properties Ferroelectric Properties Soft Matter ((long)) I. Basics Scanning Electron Microscopy (SEM) Focused Ion Beam Microscopy (FIB) Transmission Electron Microscopy (including HRTEM and STEM) Camera Systems for Dynamic TEM Experiments II. Thermodynamics Growth Processes Melting and Pre-melting Chemical Reactions and Oxidation Interface Kinetcs Formation of Silicides from a-Si and metal layers Formation of Surface Patterns observed by Reflection Electron Microscopy III. Mechanical Properties The FIB Platform Mechanical Tests in the SEM Strain Mapping by Image Correlation (SEM to HRTEM) Dislocation Mechanisms New Developments: In-situ Nanoindentation, AFM, and STM Experiments in the TEM IV. Magnetic Properties Lorentz-Microscopy Dynamic Observations of Domains, Vortices and of Ultrafast Phenomena by TEM and PEEM V. Optical Properties Cathodoluminiscence in SEM and TEM Optical Properties of Nanotubes VI. Electronic Properties EBIC (SEM) and Potential Contrast Electromigration (SEM, TEM) VII. Ferroelectric Properties Ferroelectric Domains VIII. Soft Matter Experiments using Wet-cells (SEM, ESEM, biological samples and materials) Structure Determination of Soft Matter using In-situ Techniques