Microwave radiometer instability due to infrequent calibration

We directly quantify the effect of infrequent calibration on the stability of microwave radiometer temperature measurements (where a power measurement for the unknown source is acquired at a fixed time, but calibration data are acquired at variable earlier times) with robust and nonrobust implementations of a new metric. Based on our new metric, we also determine a component of uncertainty in a single measurement due to infrequent calibration effects. We apply our metric to experimental data acquired from experimental ground-based calibration data acquired from a NASA millimeter-wave imaging radiometer and a NIST radiometer (Noise Figure Radiometer-NFRad). Based on a stochastic model for the NFRad, we determine the random uncertainty of an empirical prediction model of our stability metric by a Monte Carlo method. For comparison purposes, we also present a secondary metric that quantifies stability for the case where calibration data are acquired at a fixed time, but power measurements for the unknown source are acquired at variable later times.