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Pico-metrology and odometry with topological light and free electrons: Fundamental studies and technological applications
Pico-metrology and odometry with topological light and free electrons: Fundamental studies and technological applications
2021
Carolina Rendón-Barraza
Eng Aik Chan
Jinxiang Li
Tongjun Liu
Kevin F. MacDonald
Jun-Yu Ou
Dimitrios Papas
Nikitas Papasimakis
Eric Plum
Tanchao Pu
Guanghui Yuan
Nikolai Zheludev
Keywords:
Free electron model
Optics
Odometry
Metrology
Physics
Correction
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