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Scanning Probe Microscopy of Semiconducting Nanowires
2005
Keywords:
- Non-contact atomic force microscopy
- Scanning confocal electron microscopy
- Scanning probe microscopy
- Scanning Hall probe microscope
- Vibrational analysis with scanning probe microscopy
- Analytical chemistry
- Scanning ion-conductance microscopy
- Scanning capacitance microscopy
- Scanning gate microscopy
- Condensed matter physics
- Materials science
- Nanotechnology
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