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Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method
Determination of the Nonlinear Contribution to Refraction of Compressed Xenon at λ = 308 nm by the Self-Diffraction Method
1999
V. V. Bertsev
S. F. Bureiko
A. Yu. Karklit
A. A. Pastor
P. Yu. Serdobintsev
Keywords:
Nonlinear system
Optics
Diffraction
Xenon
Refraction
Materials science
Lambda
Correction
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