Diffusion of Water in SiO2 at Low Temperature
1985
15N hydrogen profiling is used to study diffusion of water in fused silica at 90°C. Two different diffusion mechanisms are observed, one with D~6×10-18 cm2/sec and one with D=10-15 cm2/sec. These results are compared to measurements of others and the possible origin of these two diffusions are briefly discussed.
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