Atomic resolution noncontact atomic force and scanning tunneling microscopy of TiO2(110)-(1 x 1) and - (1 x 2): simultaneous imaging of surface structures and electronic states.
2001
We present simultaneous imaging of TiO2110-1 3 1 and -1 3 2 using noncontact atomic force microscopy (NC-AFM) and scanning tunneling microscopy (STM). The surface topography was imaged under NC-AFM feedback, while the surface electronic states were imaged by STM. The image contrasts of NC-AFM and STM were antiphase in 1 3 1 and in phase in 1 3 2. The uppermost oxygen and Ti atoms underneath were, respectively, imaged by NC-AFM and STM. The NC-AFM image contrast was close to the true surface topography in 1 3 2, but reduced in 1 3 1.
Keywords:
- Nanotechnology
- Scanning probe microscopy
- Spin polarized scanning tunneling microscopy
- Scanning ion-conductance microscopy
- Atomic physics
- Conductive atomic force microscopy
- Photoconductive atomic force microscopy
- Scanning tunneling microscope
- Scanning capacitance microscopy
- Analytical chemistry
- Kelvin probe force microscope
- Physics
- Non-contact atomic force microscopy
- Scanning tunneling spectroscopy
- Optoelectronics
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
1
References
39
Citations
NaN
KQI