Test Generation from Boolean Generator for Detection of Missing Gate Faults (MGF) in Reversible Circuit Using Boolean Difference Method

Bappaditya Mondal,Chandan Bandyopadhyay,Dipak Kumar Kole,Debesh K. Das,Hafizur Rahaman

Test Generation from Boolean Generator for Detection of Missing Gate Faults (MGF) in Reversible Circuit Using Boolean Difference Method

2019

Bappaditya Mondal
Chandan Bandyopadhyay
Dipak Kumar Kole
Debesh K. Das
Hafizur Rahaman

ABSTRACTWith the change in commuting paradigms, the demands in industries have changed accordingly. Consequently, efficient design models and related technologies have evolved as prime driving fact...

Keywords:

Electronic engineering
Mathematics
Prime (order theory)
reversible circuits
boolean difference
Arithmetic

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