Electronic band structure of DC-sputtered Bi2Sr2CaCu2O8+δ

1995 
Abstract We have performed angle-resolved photoemission measurements on cleaved thin films of Bi 2 Sr 2 CaCu 2 O 8+δ in the normal state. We find that the valence band features, the Fermi edge, and the core levels are identical to those reported for cleaved single crystals. The results indicate that cleaved thin films can be used to study cuprate materials in a wider part of the phase diagram than accessible by using single crystal samples.
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