Use of quantitative convergent-beam electron diffraction in materials science

Methods for quantitative convergent-beam electron diffraction are outlined and some results of our applications of convergent-beam electron diffraction are shown, with emphasis on quantitative analysis of crystal structures in materials science. Examples of thickness measurements and determination of lattice parameters are presented. Measurements of low-order structure factors to obtain information on bonding charge-density distributions are reviewed, with examples from TiAl intermetallics. For non-centrosymmetric crystals, a method to determine three-phase structure invariants is given. Determination of polarity is also discussed. Microsc. Res. Tech. 46:130–145, 1999. © 1999 Wiley-Liss, Inc.