Direct imaging of plasma-polymerized chemical micropatterns

Both XPS and time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging have been used to characterize chemically micropatterned surfaces formed by plasma polymerization, using a copper transmission electron microscope grid as a mask. Micropatterns of spatially distinct regions of fluorine, carboxylic acid and hydrocarbon functionalities have been imaged by ToF-SIMS, whereas imaging XPS has demonstrated the ability to produce patterns of nitrogen-containing functionalities. Features as small as 50μm bars and 75μm ‘islands’ have been imaged. The utility of these chemically defined patterns has been demonstrated by the spatial binding of protein and by the attachment of cerebellar granule neurons. Copyright © 2001 John Wiley & Sons, Ltd.