Analysis of the Goos Hanchen Shift for a planar interface of NID dielectric and general medium

Abstract Analysis of Goos Hanchen shift (GHS) for a planar interface of non-integer dimensional (NID) dielectric and general medium is presented. General medium in our case can be modified into strongly absorbing, weakly absorbing or lossless dielectric medium. However, strongly absorbing medium- i.e. metals, would be our main focus in this communication. The impact of the variation of NID parameter upon the GHS and reflection coefficient is scrutinized. As previously established, a large negative shift in the case of a metal can be easily observed experimentally due to strong reflection.