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Improved Performance and Sufficient Reliability In 0.53 Ga 0.47 As FinFET Using NH3 Plasma Treatment
Improved Performance and Sufficient Reliability In 0.53 Ga 0.47 As FinFET Using NH3 Plasma Treatment
2017
K. S. Yang
Q.H Luc
C. C. Chang
J. W. Lin
C.-C.F. Chiang
H.B Do
M. T. H. Ha
S.H. Huynh
Y. D. Jin
T. A. Nguyen
Y C Lin
E. Y. Chang
Keywords:
Optoelectronics
Plasma
Materials science
Biomedical engineering
plasma treatment
improved performance
Correction
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