Influence of the bottom metal electrode and gamma irradiation effects on the performance of HfO2-based RRAM devices
2019
ABSTRACTHafnium oxide-based Resistive Random Access Memory (RRAM) devices have been fabricated with Ag as the top electrode. Au and Pt have been used as bottom electrodes in two different sets to s...
Keywords:
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
25
References
4
Citations
NaN
KQI