The near-field microwave microscopy of nanometer metal layers

The description of near-field microwave microscope based on the semiconductor Gunn-diode autodyne oscillator is presented. The probe of the microwave microscope was created on the base on the waveguide-to-microcoaxial adapter with a centre conductor jutted out of the outer conductor. Using the created autodyne near-field microwave microscope the microwave imaging with high space resolution was demonstrated. The relief and electrophysical properties of the ceramic plate surface with the applied metal layer were imaged.