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Plasma Surface Preparation of III-V Materials: Quasi In-Situ XPS Measurements and Integration Guidelines
Plasma Surface Preparation of III-V Materials: Quasi In-Situ XPS Measurements and Integration Guidelines
2019
Nicolas Coudurier
F. Boyer
Bernard Pelissier
Laura Toseli
Christophe Licitra
Denis Mariolle
Nicolas Chevalier
Philippe Rodriguez
Keywords:
Plasma
Analytical chemistry
In situ
Materials science
X-ray photoelectron spectroscopy
plasma surface
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