Key Technology of Data Registration for Large Aperture Aspheric Surface Measurement

Tongqun Ren,Yinbiao Guo,Xiaolong Ke

Key Technology of Data Registration for Large Aperture Aspheric Surface Measurement

2010

Tongqun Ren
Yinbiao Guo
Xiaolong Ke

Conference Name:5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Optical Test and Measurement Technology and Equipment. Conference Address: Dalian, PEOPLES R CHINA. Time:APR 26-29, 2010.

Keywords:

Connectivity
Coordinate system
Aperture
Computer vision
Engineering
Artificial intelligence
surface measurement
large aperture
optical test
Sampling (statistics)
data registration
Engineering drawing

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