Resistor assembly and ammeter
2001
Resistance arrangement (7, 3, 8), which is disposed on a semiconductor device (1, 2) or part of the semiconductor device (1, 2), with an associated Ausweiteschaltung for evaluating a voltage drop across the resistor arrangement (7, 3, 8), those on the semiconductor device (1, 2) is arranged, characterized in that the resistor arrangement (7, 3, 8) and the evaluation circuit on the semiconductor device (1, 2, 3, 4, 5) are monolithically integrated and the resistance arrangement (7 , 3, 8) in addition to a first doped region (3) another similarly doped region (4), which (from the first area (3) by an isolation region 5) is disconnected.
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