Fourier Transform Surface Ionization Ion Mobility Spectrometer

Surface ionization ion mobility spectrometer(SI-IMS)has the advantages of high sensitivity and short response time,which is recognized as one of the best devices for the detection of trace level nitrogenous organic contaminants.The Fourier transform method was applied to a SI-IMS to improve the signal-to-noise ratio(SNR)of the device.It has been found that the experimental SNR of the Fourier transform surface ionization ion mobility spectrometer(FT-SI-IMS)is enhanced by 3 to 5 times compared with that of the single-scan process.The performance of FT-SI-IMS in linear frequency sweep mode and step frequency sweep mode was compared through the analysis of trace tri-ethylamine.Collection period of the linear frequency sweep mode is shorter and the SNR is higher.To achieve the same SNR,the collection period of the linear frequency sweep mode is only about 1/4 of the signal-averaged process.